Demo Event I

Precision in Practice: The FX40 AFM Live Demo

18 September

This demonstration will show live atomic force microscopy (AFM) measurements on the FX40 microscope from Park Systems. The FX40 is a fully equipped AFM that combines high performance with superior ease-of-use. Tip exchange and alignment is fully automated, meaning handling of probes with tweezers is a thing of the past. A sample view camera allows the user to pick and choose locations to carry out a series of automated measurements. The demonstration will show all these features and more, including the acquisition of measurements in real time. The demonstration will also show how we can seamlessly switch between measurement modes without hardware changes, where we can carry out Kelvin probe force microscopy (SKPM) and conductive-AFM (C-AFM) at the same location by simply switch settings in the software.