Advanced Characterization Techniques: Bridging Structures and Functions in Materials


19 Sept.			09:00 - 10:30



CHARACTERIZATION & METROLOGY

ADVANCED MATERIALS
TT.IX - Technical Parallel Track Sessions
Advanced Characterization Techniques: Bridging Structures and Functions in Materials
Session organized by Sapienza University of Rome Chair: Marco AGOSTINI, Sapienza University of Rome
Understanding the structural, chemical, and functional properties of materials is essential for optimizing their performance and mechanisms. This session will highlight recent advances in advanced characterization methods, integrating electron microscopy, spectroscopic techniques, surface and porosity analysis, X-ray-based methods and scanning probe microscopy (AFM and related techniques), enabling micro-and nanoscale resolution of electronic, mechanical, and chemical properties, as well as in situ and operando studies that capture material behaviour under real working conditions. The session will explore how a multi-technique approach allows for a deeper correlation between structure, morphology, and functional properties, providing key insights into the understanding of links between performances and properties.
*The symposium is part of YoungInnovation (FE.II)*
TT.IX.H.1 FE.II.18.1	Introductive Keynote Livia ANGELONI Sapienza University of Rome Atomic Force Microscopy based characterization of biomaterials and cell-biomaterials interactions
TT.IX.H.2 FE.II.18.2	Md Ashiqur Rahman LASKAR - CV Arizona State University, USA Redefining Conductive AFM: Electron Beam Assisted Innovation Beyond Classical Limits
TT.IX.H.3 FE.II.18.3	Anna LAŠTOVIČKOVÁ - CV Department of Physical and Macromolecular Chemistry, Faculty of Science, Charles University, Prague, Czech Republic Stabilizing single atoms on 2D zeolites to develop sustainable catalysts
TT.IX.H.4 FE.II.18.4	Riccardo PALLUCCHI - CV Sapienza University of Rome Nitrogen-induced strain in highly mismatched III-V heterostructured nanowires: a Raman spectroscopy investigation
TT.IX.H.5 FE.II.18.5	Giorgia SEMENTILLI - CV University of Rome "Tor Vergata" Atomic-scale characterization of a 2D/3D topological insulator interface: the Bi/Sb2Te3 system