Innovation Beyond Borders: Advances in Microscopy and Imaging 1/2


18 Sept.			14:00 - 15:30

ROOM 38

CHARACTERIZATION & METROLOGY
TT.VII - Technical Parallel Track Sessions
Innovation Beyond Borders: Advances in Microscopy and Imaging 1/2
Co-organized with Sapienza University of Rome Chairs: Andrzej SIKORA, Wroclaw University of Science and Technology, Poland \| Daniele PASSERI, Sapienza University of Rome
This Symposium, organized in two sessions, will cover groundbreaking developments that are redefining the frontiers of microscopy and imaging across disciplines. In particular, it will focus on recent advances in characterization methodologies based on atomic force microscopy (AFM) and their applications in different fields of science and technology, including nano-bio-technologies playing a significant role. Recent progress in high-speed AFM will be highlighted, showcasing how real-time imaging of dynamic nanoscale events is revolutionizing research in biology and materials science. The talks will cover advances in AFM-based mechanical testing, emphasizing new applications in materials science and soft matter. Additionally, the use of microfluidic technologies combined with AFM will be dpresented, illustrating how these methods allow precise in situ analysis of cellular and subcellular environments under conditions that mimic physiology. We will also discuss how machine learning speeds up data analysis, pattern detection, and predictive modeling, thus improving the efficiency of microscopic studies.

TT.VII.G.1	Mingdong DONG - CV Aarhus University, Denmark Probing nanoscale friction in two-dimensional materials via atomic force microscopy
TT.VII.G.2	Feng-Yueh CHAN - CV Nagoya University, Japan From Still to Motion: High-Speed AFM's Role in Advancing Scientific Understanding
TT.VII.G.3	Gunjan AGARWAL - CV The Ohio State University, USA Advances in magnetic force microscopy of superparamagnetic iron oxide nanoparticles
TT.VII.G.4	Paweł JANUS - CV Łukasiewicz – Institute of Microelectronics and Photonics (IMiF) MEMS Technologies for Nanometrology Instruments. Design and applications