This workshop offers a comprehensive overview of the latest advancements in Atomic Force Microscopy (AFM) technology, with a focus on cutting-edge developments that are transforming nanoscale imaging and analysis. Participants will be introduced to recent breakthroughs in AFM hardware and software, how new AFM systems are giving the ability to perform correlative measurements of multiple physical properties in an easier way and going beyond topography imaging.

A key highlight of the workshop is the increasing automation in AFM systems, which now allow for easier operation, reduced user dependency, and more consistent data acquisition. Automated workflows, including tip engagement, parameter optimization, and image processing, are streamlining operations and making AFM more accessible to both novice and expert users.

The workshop will also explore high-throughput AFM capabilities, which are essential for large-scale sample screening and industrial applications. Multi-sample handling, parallel scanning, easy data analysis are enabling researchers and engineers to achieve unprecedented productivity without compromising resolution or accuracy.

Attendees will gain practical insights through live demonstrations and discussions with experts, equipping them with the knowledge to leverage modern AFM tools for advanced research.