This workshop gathers a multidisciplinary group of scientists and specialists to share perspectives on cutting-edge ITO analysis techniques. Organized by Gambetti Kenologia and KLA Instruments, the event will showcase diverse metrology techniques for thin film characterization. Participants will engage in discussions on current developments in ITO stress analysis and gain hands-on experience with reflectometry and optical profilometry tools. The program is designed to foster collaboration and deepen understanding of precision metrology in thin film applications.